Hamamatsu Develops Rapid Micro-LED Inspection Tool

MiNY PL tool detects abnormalities in external appearance, intensity and wavelength of micro-LED light emissions

Hamamatsu Photonics has developed a system for high-speed inspection of micro-LEDs on wafers. Called the MiNY PL, the tool is designed to detect abnormalities in the LED’s external appearance, intensity and wavelength of their light emissions.

This inspection system uses a photoluminescence (PL) measurement technique that is based on the company’s image processing technology and a newly developed imaging module.

According to the company, the MiNY PL makes fast pass/fail decisions when inspecting micro-LEDs, which will contribute to an increased product yield for use in display applications and will also help to increase the R&D efficiency of micro-LEDs.

Furthermore, the MiNY PL will also streamline the 100 percent inspection process of micro-LEDs in future mass production lines.

 

Source: Compound Semiconductor

Disclaimers of Warranties
1. The website does not warrant the following:
1.1 The services from the website meets your requirement;
1.2 The accuracy, completeness, or timeliness of the service;
1.3 The accuracy, reliability of conclusions drawn from using the service;
1.4 The accuracy, completeness, or timeliness, or security of any information that you download from the website
2. The services provided by the website is intended for your reference only. The website shall be not be responsible for investment decisions, damages, or other losses resulting from use of the website or the information contained therein

Proprietary Rights


You may not reproduce, modify, create derivative works from, display, perform, publish, distribute, disseminate, broadcast or circulate to any third party, any materials contained on the services without the express prior written consent of the website or its legal owner.