MiNY PL tool detects abnormalities in external appearance, intensity and wavelength of micro-LED light emissions
Hamamatsu Photonics has developed a system for high-speed inspection of micro-LEDs on wafers. Called the MiNY PL, the tool is designed to detect abnormalities in the LED’s external appearance, intensity and wavelength of their light emissions.
This inspection system uses a photoluminescence (PL) measurement technique that is based on the company’s image processing technology and a newly developed imaging module.
According to the company, the MiNY PL makes fast pass/fail decisions when inspecting micro-LEDs, which will contribute to an increased product yield for use in display applications and will also help to increase the R&D efficiency of micro-LEDs.
Furthermore, the MiNY PL will also streamline the 100 percent inspection process of micro-LEDs in future mass production lines.
Source: Compound Semiconductor
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